Dealing with Noise in Defect Prediction
題目： Dealing with Noise in Defect Prediction 作者： Sunghun Kim, Hongyu Zhang, Rongxin Wu, Liang Gong 單位： Hongkong University of Science and Technology, Tsinghua University 出版： ICSE 解決的問題 提出了一種方法，用來解決缺陷信息
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相關文章
- 1. Dealing with Scale in AR
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- 3. Personalized Defect Prediction
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